Transient temperature effects in CTD measurements

Abstract

We discuss the effect of the changing temperature of CTD electronics on the measured pressure and temperature. An example is presented from a Guildline 8715 CTD which illustrates that substantial errors in measured quantities (order 10 m °C in temperature for our example) can result from transient effects not detectable by static tests of electronic stability. We use a simple linear system model to investigate the effect and to correct data. Such a model is necessary simply to permit quantification of the effect and to enable the design and interpretation of laboratory experiments for that purpose.