{"title":"Characteristic features of electrical treeing in XLPE and PE","authors":"J.J. Yang, S. Brilasekaran","doi":"10.1109/IPEC.2005.206874","DOIUrl":null,"url":null,"abstract":"In this preliminary study, electrical tree formation in 220 kV XLPE insulation sample and transparent PE sample was diagnosed by PD measurements and physical observation. Increased electrical stress due to cable joints was simulated by point-plane electrode configuration. Various analyses for PD pulses distribution in 20 ms and single pulses were carried out in three experiments to compare the effects of applied voltage, rate of rise of applied voltage, and period of constant voltage stress. Two types of electrical trees have been found out based on PD analysis and optical recording. Observed light emission supported the theory of emission by protons due to high-energy electrons. The analysis was supported with dielectrometry measurements on the sample before and after tree formation","PeriodicalId":164802,"journal":{"name":"2005 International Power Engineering Conference","volume":"28 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2005 International Power Engineering Conference","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IPEC.2005.206874","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
In this preliminary study, electrical tree formation in 220 kV XLPE insulation sample and transparent PE sample was diagnosed by PD measurements and physical observation. Increased electrical stress due to cable joints was simulated by point-plane electrode configuration. Various analyses for PD pulses distribution in 20 ms and single pulses were carried out in three experiments to compare the effects of applied voltage, rate of rise of applied voltage, and period of constant voltage stress. Two types of electrical trees have been found out based on PD analysis and optical recording. Observed light emission supported the theory of emission by protons due to high-energy electrons. The analysis was supported with dielectrometry measurements on the sample before and after tree formation
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