Different Input Impedance Matching Circuits for Cascode Common Source LNA with Inductive Degeneration Topology in 45nm CMOS Technology

Malti Bansal, Diksha Singh
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引用次数: 5

Abstract

This paper presents various input impedance matching networks that can be used for cascode common source LNA with inductive degeneration topology in 45 nm CMOS technology. We review the matching networks being used and analyze their performance using simulations. Based on our simulation results, we further conclude that T-Matching network is the best input impedance matching network for cascode common source LNA with inductive degeneration topology in 45 nm CMOS technology.
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45纳米CMOS电感退化级联共源LNA的不同输入阻抗匹配电路
提出了可用于45纳米CMOS级联编码共源LNA电感退化拓扑的各种输入阻抗匹配网络。我们回顾了正在使用的匹配网络,并通过仿真分析了它们的性能。基于我们的仿真结果,我们进一步得出t匹配网络是45 nm CMOS技术中具有感应退化拓扑的级联共源LNA的最佳输入阻抗匹配网络。
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