{"title":"The Malfunction and Immunity limit of Information technology equipment under HPEM environments","authors":"H. Sekiguchi, S. Seto, I. Minematsu","doi":"10.1109/EMCZUR.2009.4783392","DOIUrl":null,"url":null,"abstract":"This paper presents the investigation results of the relation with the malfunction and the immunity limit of an Ethernet hub that is put in the high-power electromagnetic (HPEM) environments. Several HPEM environments are built to induce the malfunction of the Ethernet hub. First, the radiated HPEM environments are built using a transverse electromagnetic (TEM) cell. Next, the conducted HPEM environment was built using a bulk current injection (BCI) method. From these test experiments, it is discussed on the relation with the malfunction and the immunity limit of the Ethernet hub.","PeriodicalId":192851,"journal":{"name":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","volume":"87 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"2","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 20th International Zurich Symposium on Electromagnetic Compatibility","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/EMCZUR.2009.4783392","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 2
Abstract
This paper presents the investigation results of the relation with the malfunction and the immunity limit of an Ethernet hub that is put in the high-power electromagnetic (HPEM) environments. Several HPEM environments are built to induce the malfunction of the Ethernet hub. First, the radiated HPEM environments are built using a transverse electromagnetic (TEM) cell. Next, the conducted HPEM environment was built using a bulk current injection (BCI) method. From these test experiments, it is discussed on the relation with the malfunction and the immunity limit of the Ethernet hub.
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