Waveguide Technique for Thin Metallic Film Surface Impedance Determination

Abstract

The technique for determination of surface impedances of electrically thin film membranes having metallic properties is suggested. The method is based on results of measuring the frequency characteristics of reflection and transmission coefficients of the section of a rectangular waveguide with the membrane which completely fills its cross section. The homogeneous metallic plate of finite thickness and two-layered metal-dielectric film are studied as two types of the membrane. For these cases the formulas for direct analytical estimation of the impedance of the membrane medium are obtained. The numerical simulations for the cases of bismuth and two-layered membranes at 10 GHz are considered.