{"title":"Extraction of thermal parameters for bipolar circuit simulation","authors":"D. T. Zweidinger, R. Fox, S. Lee, T. Jung","doi":"10.1109/BIPOL.1995.493871","DOIUrl":null,"url":null,"abstract":"A method is presented for extracting the temperature dependences of bipolar transistor terminal currents, while cancelling effects of self-heating. The method allows extraction at high currents where simple models fail. Results can also be used to extract thermal impedance to model self-heating in suitably modified circuit simulators.","PeriodicalId":230944,"journal":{"name":"Proceedings of Bipolar/Bicmos Circuits and Technology Meeting","volume":"23 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1995-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of Bipolar/Bicmos Circuits and Technology Meeting","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/BIPOL.1995.493871","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
A method is presented for extracting the temperature dependences of bipolar transistor terminal currents, while cancelling effects of self-heating. The method allows extraction at high currents where simple models fail. Results can also be used to extract thermal impedance to model self-heating in suitably modified circuit simulators.
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