{"title":"Hardware development and validation of DC Circuit Breaker using counter-current injection method","authors":"Muhammad Maaz Qaiser, Ali Virdag","doi":"10.1109/eGRID48559.2020.9330365","DOIUrl":null,"url":null,"abstract":"This paper presents development of hardware along with testing of DC (Direct Current) circuit breaker using counter current injection method [1]. The optimized implementation of the system is achieved using the simulation results of the DC circuit breaker topology. To analyze the behavior of prototype on high current, a test bench circuit is developed. The current and voltage sensors are used to sense various outputs during the realization of prototype. The data acquisition is done using LabView. The operating time of clearing fault current with different nature of loads has been discussed in this paper.","PeriodicalId":296524,"journal":{"name":"2020 5th IEEE Workshop on the Electronic Grid (eGRID)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-11-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2020 5th IEEE Workshop on the Electronic Grid (eGRID)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/eGRID48559.2020.9330365","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
This paper presents development of hardware along with testing of DC (Direct Current) circuit breaker using counter current injection method [1]. The optimized implementation of the system is achieved using the simulation results of the DC circuit breaker topology. To analyze the behavior of prototype on high current, a test bench circuit is developed. The current and voltage sensors are used to sense various outputs during the realization of prototype. The data acquisition is done using LabView. The operating time of clearing fault current with different nature of loads has been discussed in this paper.