W. Pan, A. Tsai, Fa-Yen Cheng, T. Chen, Ming-Tzer Lin
{"title":"DIC Image on FIB Ring-Core Analysis of Depth Sensing Residual Stress Measurement of Thin Films","authors":"W. Pan, A. Tsai, Fa-Yen Cheng, T. Chen, Ming-Tzer Lin","doi":"10.1007/978-3-319-97481-1_15","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":212315,"journal":{"name":"Conference Proceedings of the Society for Experimental Mechanics Series","volume":"38 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Conference Proceedings of the Society for Experimental Mechanics Series","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-319-97481-1_15","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
分享
求助内容：
应助结果提醒方式：
扫码关注我们
