{"title":"Electron Backscatter Diffraction","authors":"D. Field, Mukul Kumar","doi":"10.1201/9781351045636-140000410","DOIUrl":null,"url":null,"abstract":"Electron backscatter diffraction (EBSD) is a scanning electron microscope (SEM) based technique that is used to obtain local information on the crystallographic character of bulk crystalline and polycrystalline materials. Topics discussed in this article include: EBSD system overview, multiphase analysis, and application to aluminum integrated circuit interconnects, dislocation structure analysis, analysis of grain boundary networks, and application to friction stir welding of aluminum alloys.","PeriodicalId":348912,"journal":{"name":"Encyclopedia of Aluminum and Its Alloys","volume":"136 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2018-11-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"12","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Encyclopedia of Aluminum and Its Alloys","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1201/9781351045636-140000410","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 12
Abstract
Electron backscatter diffraction (EBSD) is a scanning electron microscope (SEM) based technique that is used to obtain local information on the crystallographic character of bulk crystalline and polycrystalline materials. Topics discussed in this article include: EBSD system overview, multiphase analysis, and application to aluminum integrated circuit interconnects, dislocation structure analysis, analysis of grain boundary networks, and application to friction stir welding of aluminum alloys.
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