{"title":"Fault Tolerance Method of Space Vector Pulse Width Modulation for Current - Tracking Single - Phase Reconfigurable Multilevel Inverter","authors":"Guohua Li, Jiaxiang Li, Zaiqing Xu, Rongyu Dong","doi":"10.1109/ICPEA56363.2022.10052237","DOIUrl":null,"url":null,"abstract":"In view of the increase of power semiconductor devices in multilevel inverter, the probability of device fault increases. A fault tolerant control method of current tracking multilevel inverter hysteresis loop was proposed based on space vector pulse width modulation. Thus the reliability of inverter system and the fault tolerance of the topology can be improved, so as to ensure that the output current can accurately track the reference current in the case of single transistors open circuit, the most of double-tube open circuit and part of the three-tube open circuit fault states. The simulation and experiment validate the proposed method.","PeriodicalId":447871,"journal":{"name":"2022 5th International Conference on Power and Energy Applications (ICPEA)","volume":"36 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 5th International Conference on Power and Energy Applications (ICPEA)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/ICPEA56363.2022.10052237","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
In view of the increase of power semiconductor devices in multilevel inverter, the probability of device fault increases. A fault tolerant control method of current tracking multilevel inverter hysteresis loop was proposed based on space vector pulse width modulation. Thus the reliability of inverter system and the fault tolerance of the topology can be improved, so as to ensure that the output current can accurately track the reference current in the case of single transistors open circuit, the most of double-tube open circuit and part of the three-tube open circuit fault states. The simulation and experiment validate the proposed method.