Alireza Salimy, I. Mitiche, P. Boreham, A. Nesbitt, G. Morison
{"title":"Can a deep learning based IoT fault diagnosis system identify more than one fault at a time?","authors":"Alireza Salimy, I. Mitiche, P. Boreham, A. Nesbitt, G. Morison","doi":"10.1109/IoTaIS56727.2022.9976013","DOIUrl":null,"url":null,"abstract":"The experiments in this study propose a fault diagnosis method to incorporate in an internet-of-things (IoT) system for the condition monitoring of high-voltage generating stations. The approach is based on feature extraction with signal processing methods and a deep learning model to tackle fault classification in measured signals that contain one or more faults simultaneously. The proposed system implements feature extraction through the short-time Fourier transform (STFT) of 1-D electro-magnetic interference (EMI) fault signals obtained from online high-voltage (HV) assets. The produced feature maps are then used in parallel with label word embeddings to train and test a deep learning model consisting of, a graph convolutional network (GCN), implemented to learn inter-dependant fault label relationships from label co-occurrence matrices and label word embeddings, and a convolutional neural network (CNN) to extract relevant features from STFT data representations. The proposed system tackles the under-addressed EMI multi-label HV fault diagnosis problem and produces strong results in label classification even when implemented on a heavily imbalanced data set, to the author’s knowledge the system provides an unprecedented level of performance that is industrially acceptable in fault diagnosis and can be successfully implemented on a real-world IoT-based condition monitoring system. In addition, in theory the proposed system is scalable for the prediction of a higher quantity of fault labels present in data instances.","PeriodicalId":138894,"journal":{"name":"2022 IEEE International Conference on Internet of Things and Intelligence Systems (IoTaIS)","volume":"15 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2022-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2022 IEEE International Conference on Internet of Things and Intelligence Systems (IoTaIS)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/IoTaIS56727.2022.9976013","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The experiments in this study propose a fault diagnosis method to incorporate in an internet-of-things (IoT) system for the condition monitoring of high-voltage generating stations. The approach is based on feature extraction with signal processing methods and a deep learning model to tackle fault classification in measured signals that contain one or more faults simultaneously. The proposed system implements feature extraction through the short-time Fourier transform (STFT) of 1-D electro-magnetic interference (EMI) fault signals obtained from online high-voltage (HV) assets. The produced feature maps are then used in parallel with label word embeddings to train and test a deep learning model consisting of, a graph convolutional network (GCN), implemented to learn inter-dependant fault label relationships from label co-occurrence matrices and label word embeddings, and a convolutional neural network (CNN) to extract relevant features from STFT data representations. The proposed system tackles the under-addressed EMI multi-label HV fault diagnosis problem and produces strong results in label classification even when implemented on a heavily imbalanced data set, to the author’s knowledge the system provides an unprecedented level of performance that is industrially acceptable in fault diagnosis and can be successfully implemented on a real-world IoT-based condition monitoring system. In addition, in theory the proposed system is scalable for the prediction of a higher quantity of fault labels present in data instances.