FROM DIGITAL DEVICE UNDER TEST TO DIGITAL CALIBRATION CERTIFICATE. CHALLENGES AND SOLUTIONS FOR THE CALIBRATION OF MEASURING INSTRUMENTS AND SENSORS IN THE DIGITAL FUTURE
{"title":"FROM DIGITAL DEVICE UNDER TEST TO DIGITAL CALIBRATION CERTIFICATE. CHALLENGES AND SOLUTIONS FOR THE CALIBRATION OF MEASURING INSTRUMENTS AND SENSORS IN THE DIGITAL FUTURE","authors":"Martin Nicklich, M. Mende","doi":"10.21014/tc6-2022.020","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":441252,"journal":{"name":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","volume":"82 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Proceedings of the First International IMEKO TC6 Conference on Metrology and Digital Transformation - M4Dconf2022","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.21014/tc6-2022.020","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}