{"title":"An Automation Dynamic Testing Method Based AI-Controlling of VCR","authors":"Qiuxun Ye, Tingfang Zhang","doi":"10.1109/WKDD.2009.174","DOIUrl":null,"url":null,"abstract":"To realize the dynamic testing method & collecting sampling data in process of fields in industry is a problem solving in all the time. This paper gives a novel automation dynamic testing method based AI-Controlling of VCR, it is with some advantages that as follows: 1)An excellent effectiveness for a given period of time; 2)An integrated controlling area without any spots as yet untouched by changing TC value; 3)A better computation precision of judging & analyzing; 4)A large capacity of numbers without any effective figures limited word size of CPU for its VCO. Otherwise, the dynamic testing method would be still used in drawing some curves such as not straight-line diagram for time area properties, etc.","PeriodicalId":143250,"journal":{"name":"2009 Second International Workshop on Knowledge Discovery and Data Mining","volume":"1 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2009-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2009 Second International Workshop on Knowledge Discovery and Data Mining","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/WKDD.2009.174","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
To realize the dynamic testing method & collecting sampling data in process of fields in industry is a problem solving in all the time. This paper gives a novel automation dynamic testing method based AI-Controlling of VCR, it is with some advantages that as follows: 1)An excellent effectiveness for a given period of time; 2)An integrated controlling area without any spots as yet untouched by changing TC value; 3)A better computation precision of judging & analyzing; 4)A large capacity of numbers without any effective figures limited word size of CPU for its VCO. Otherwise, the dynamic testing method would be still used in drawing some curves such as not straight-line diagram for time area properties, etc.
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