A High-Speed GCD Chip: A Case Study in Asynchronous Design

Gennette Gill, John Hansen, Ankur Agiwal, L. Vicci, Montek Singh
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引用次数: 6

Abstract

This paper presents the design of a greatest common divisor (GCD) chip as a case study in asynchronous or clockless design.  The design uses fine-grain asynchronous pipelining to achieve fairly high performance.  At the same time, the use of robust asynchronous handshaking in lieu of clocking allows the design to gracefully adapt its operation to voltage and temperature variations, without the need for clock recalibration.The design was fabricated in a 0.13$\mu$m CMOS process, using standard cells and with full testability support.  Resulting chips were evaluated for performance and robustness, using a large set of test vectors for good fault coverage.  Under nominal operating conditions (1.5V and 27C), the fabricated parts were able to deliver up to 8 giga GCD algorithmic iterations per second (equivalent to 1 GHz clock speed).  Moreover, they were functionally correct across a wide range of voltages  (0.5V to 4V) and temperatures (-45C to 150C).  This case study bolsters our confidence in the potential of aynchronous design techniques to help produce reliable ASICS that are fast, testable, and that operate under a wide range of conditions.
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高速GCD芯片:异步设计案例研究
本文介绍了一种最大公约数(GCD)芯片的设计,作为异步或无时钟设计的案例研究。该设计采用细粒度异步流水线来实现相当高的性能。同时,使用鲁棒异步握手代替时钟,使设计能够优雅地适应电压和温度变化,而无需重新校准时钟。该设计是在0.13$\mu$m CMOS工艺中制造的,使用标准电池并具有完全的可测试性支持。结果芯片的性能和鲁棒性被评估,使用大量的测试向量来获得良好的故障覆盖率。在标准工作条件下(1.5V和27C),制造的部件能够提供高达每秒8千兆GCD算法迭代(相当于1 GHz时钟速度)。此外,它们在很宽的电压范围(0.5V至4V)和温度范围(-45℃至150℃)内都是功能正确的。本案例研究增强了我们对异步设计技术潜力的信心,有助于生产快速、可测试、可在各种条件下运行的可靠ASICS。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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