{"title":"A new simplified method for soil modeling in two horizontal layers","authors":"M. T. Andrade","doi":"10.1109/urucon53396.2021.9647212","DOIUrl":null,"url":null,"abstract":"The study of grounding installations requires an adequate knowledge of the terrain. Generally, four-point methods are used to get the data: Wenner or Schlumberger. In this job, the terrain is modeled as two horizontal layers. An analysis of the interpretation of soil measurements in the IEEE 80 and 81 standards is the basis of this study. To the parametric resistivity curves provided by standard 80, for the Wenner method, the place for which the apparent resistivity is equal to the mean value of the resistivity of both layers is added. The result of this study consists of a new and simple equation that allows to determine the depth of the first layer. So, for the determination of this parameter, the graphical analysis is no longer necessary. This procedure is extended to the best-known proposal of Palmer method in the same way.","PeriodicalId":337257,"journal":{"name":"2021 IEEE URUCON","volume":"9 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2021-11-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"2021 IEEE URUCON","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1109/urucon53396.2021.9647212","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
The study of grounding installations requires an adequate knowledge of the terrain. Generally, four-point methods are used to get the data: Wenner or Schlumberger. In this job, the terrain is modeled as two horizontal layers. An analysis of the interpretation of soil measurements in the IEEE 80 and 81 standards is the basis of this study. To the parametric resistivity curves provided by standard 80, for the Wenner method, the place for which the apparent resistivity is equal to the mean value of the resistivity of both layers is added. The result of this study consists of a new and simple equation that allows to determine the depth of the first layer. So, for the determination of this parameter, the graphical analysis is no longer necessary. This procedure is extended to the best-known proposal of Palmer method in the same way.