Towards Data Driven Failure Analysis Using Infrared Thermography

Abstract

Electronic components of which reliability cannot be quantified are unacceptable and potentially hazardous, especially in safety-relevant areas such as driver assistance system and medical technology where the zero-error principle applies. Reliability as a quality criterion has its origin in production, i.e. process variations have a negative influence on the structural integrity of the contact elements on the packaging and interconnect technology and, thus on the device performance in the field under thermo-mechanical load (temperature changes, vibration, humidity). At present, to ensure reproducibility of the reliability of each component, regular quality tests are often carried out in practice. However, a better and reliable approach will carry out 100% inline checks for traceability and immediate readjustment. This work is the first step towards developing an intelligent non-destructive inline-capable failure analysis technique using infrared thermography. Good data forms the base on which robust and accurate AI algorithms can be trained and developed. However, the obtained thermographic images need to be processed so that subsurface defects can be detected. In this work, prominent algorithms, namely Pulse Phase Thermography (PPT), Thermographic Signal Reconstruction (TSR), Principal Component Analysis (PCT), Slope and Correlation Coefficient, have been thoroughly discussed and examined on the thermographic sequence from a plexiglass sample. A hybrid algorithm of TSR and PCT has also been suggested with promising results. In the end, potential post-processing algorithms from which the obtained results can be used for training an ML/AI model have been discussed.