Thin film AC ZnSxSe1-x:Mn EL

S. Miura, S. Sato
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Abstract

Conventional ZnS:Mn electroluminescence (EL) device has a good level of brightness but needs a high operating voltage. The best way to lower the operating voltage seemed to be by reducing the band gap of the host material and to achieve this, ZnSe had been proposed before. However, our experiments showed that when the ZnSe:Mn EL was operated at low voltages the brightness level and contrast ratio decreased, due to the yellowish coloration of the ZnSe film. The authors have developed a host material which combines both advantages; the high brightness level of ZnS, and the low operating voltage of ZnSe. A material with a band gap between those of ZnS (3.7 eV) and ZnSe (2.7 eV) was tested. By coevaporation of ZnS and ZnSe, a solid solution ZnSxSe1-xwas found in an evaporated film. By measuring the absorption edge and using X-ray techniques, we found that the band gap varied in proportion to the concentration of selenium. A thin film of ZnS0.4Se0.6EL sandwiched between Y2O3insulating layers can operate at a low voltage (120 V) with a high level of brightness (>100 fL at 1 KHz), with a very small upward voltage shift (10 V) during aging.
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薄膜交流 ZnSxSe1-x:Mn EL
传统的ZnS:Mn电致发光器件具有良好的亮度水平,但需要较高的工作电压。降低工作电压的最佳方法似乎是减少主体材料的带隙,为了实现这一点,ZnSe之前已经被提出过。然而,我们的实验表明,当ZnSe:Mn EL在低电压下工作时,由于ZnSe薄膜的颜色偏黄,亮度水平和对比度下降。作者开发了一种结合了这两种优点的宿主材料;ZnS的亮度高,ZnSe的工作电压低。测试了一种介于ZnS (3.7 eV)和ZnSe (2.7 eV)带隙之间的材料。通过ZnS和ZnSe的共蒸发,在蒸发膜中发现了固溶体znsxse1 -x。通过测量吸收边缘并使用x射线技术,我们发现带隙与硒的浓度成正比。夹在y2o3绝缘层之间的ZnS0.4Se0.6EL薄膜可以在低电压(120 V)下工作,具有高亮度(在1 KHz时>100 fL),并且在老化过程中具有很小的向上电压位移(10 V)。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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