Adamo Santana, Souta Inoue, Kenya Murakami, T. Iizaka, T. Matsui
{"title":"Clustering-Based Data Reduction Approach to Speed up SVM in Classification and Regression Tasks","authors":"Adamo Santana, Souta Inoue, Kenya Murakami, T. Iizaka, T. Matsui","doi":"10.1007/978-3-030-55789-8_42","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":357450,"journal":{"name":"International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems","volume":"63 1","pages":"0"},"PeriodicalIF":0.0000,"publicationDate":"2020-09-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"1","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"International Conference on Industrial, Engineering and Other Applications of Applied Intelligent Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1007/978-3-030-55789-8_42","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}