A miniature micro-machined millimeter-wave bandpass filter by CMOS compatible ICP deep-trench technology

Jin-Fa Chang, Yo‐Sheng Lin, Chi-Chen Chen, Chang‐Zhi Chen, Tao Wang, Shey-Shi Lu
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引用次数: 1

Abstract

We demonstrate that miniature millimeter-wave (MMW) band-pass filter can be obtained by replacing the traditional eoplanar waveguide structures with the miniature lumped-spiral inductors and metal-insulator-metal (MIM) capacitors. To study the substrate effects on the performances of the spiral inductor and filter, CMOS-compatible backside inductively-coupled-plasma (ICP) deep trench technology was used to selectively remove the silicon underneath them. The results show that a 70.9% (from 5.8 to 9.91) and a 298.7% (from 2.33 to 9.29) increase in Q-factor were achieved at 40 GHz and 60 GHz, respectively, for a 251.7 pH inductor after the ICP etching. In addition, a 0.9 dB (from -5.4 dB to -4.6 dB) improvement in peak insertion loss (S23) was achieved for the miniature bandpass filter with 3-dB bandwidth of 47.7 GHz (18.4 ~ 66.1 GHz) after the ICP etching. The chip area of the miniature filter was only 206 mum x 106 mum excluding the test pads.
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采用CMOS兼容ICP深沟技术的微型微机械毫米波带通滤波器
我们证明了用微型集总螺旋电感和金属-绝缘体-金属(MIM)电容器取代传统的平面波导结构可以获得微型毫米波(MMW)带通滤波器。为了研究衬底对螺旋电感和滤波器性能的影响,采用cmos兼容的背面电感耦合等离子体(ICP)深沟槽技术选择性去除其下方的硅。结果表明,对于pH值为251.7的电感,在40 GHz和60 GHz频段的q因子分别提高了70.9%(从5.8提高到9.91)和298.7%(从2.33提高到9.29)。此外,对于3db带宽为47.7 GHz (18.4 ~ 66.1 GHz)的微型带通滤波器,经过ICP刻蚀后,峰值插入损耗(S23)提高了0.9 dB(从-5.4 dB到-4.6 dB)。微型滤波器的芯片面积仅为206 μ m × 106 μ m,不包括测试垫。
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