IMS Awards: An Innovative Data-Driven Reliability Life Cycle for Complex Systems

IF 1.6 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC IEEE Instrumentation & Measurement Magazine Pub Date : 2023-11-01 DOI:10.1109/mim.2023.10292592
Gabriele Patrizi
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引用次数: 0

Abstract

In the last few years, reliability assessment acquired a fundamental role in many advanced technology applications. System downtime and unexpected failures massively affect the productivity of a system/product/plant. As a consequence, the Reliability, Availability, Maintainability, and Safety (RAMS) disciplines, together with diagnostics and prognostics tools are becoming more and more essential for several application fields, especially in case of complex industrial systems where environment, personnel, and equipment safety are mandatory features.
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IMS奖项:复杂系统的创新数据驱动可靠性生命周期
在过去几年中,可靠性评估在许多先进技术应用中发挥了重要作用。系统停机和意外故障会严重影响系统/产品/工厂的生产效率。因此,可靠性、可用性、可维护性和安全性(RAMS)学科以及诊断和预测工具在一些应用领域变得越来越重要,特别是在环境、人员和设备安全是强制性特征的复杂工业系统的情况下。
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来源期刊
IEEE Instrumentation & Measurement Magazine
IEEE Instrumentation & Measurement Magazine 工程技术-工程:电子与电气
CiteScore
4.20
自引率
4.80%
发文量
147
审稿时长
>12 weeks
期刊介绍: IEEE Instrumentation & Measurement Magazine is a bimonthly publication. It publishes in February, April, June, August, October, and December of each year. The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.
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