Mei Qiao, Tie-Jun Wang, Yong Liu, Tao Liu, Zhenxing Wang, Wanling Cui, Xiaoxin Wang, Xin Li, shicai xu
{"title":"Damage, waveguide and electrical properties in (La, Sr)(Al, Ta)O3 single crystal irradiated with carbon ions","authors":"Mei Qiao, Tie-Jun Wang, Yong Liu, Tao Liu, Zhenxing Wang, Wanling Cui, Xiaoxin Wang, Xin Li, shicai xu","doi":"10.1364/josab.501291","DOIUrl":null,"url":null,"abstract":"The (La, Sr)(Al, Ta)O 3 crystal was irradiated via 20.0 MeV C ion with fluence of 1.0×10 15 ions/cm 2 . The Rutherford backscattering (RBS)/channeling spectra, the hardness and elastic modulus as continuous functions of the depth, and X-ray diffraction (XRD) are used to analyze the irradiation damage, hardness, and structural changes in the near-surface area of samples. Prism coupling and end-face coupling methods were used to study the changes of optical waveguide properties under different annealing conditions. Considering the potential applications of low-loss waveguide structure in photoelectric sensors, electrical properties of (La, Sr)(Al, Ta)O 3 samples were studied as an important detection indicator of sensors.","PeriodicalId":17280,"journal":{"name":"Journal of The Optical Society of America B-optical Physics","volume":null,"pages":null},"PeriodicalIF":1.8000,"publicationDate":"2023-09-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of The Optical Society of America B-optical Physics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/josab.501291","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0
Abstract
The (La, Sr)(Al, Ta)O 3 crystal was irradiated via 20.0 MeV C ion with fluence of 1.0×10 15 ions/cm 2 . The Rutherford backscattering (RBS)/channeling spectra, the hardness and elastic modulus as continuous functions of the depth, and X-ray diffraction (XRD) are used to analyze the irradiation damage, hardness, and structural changes in the near-surface area of samples. Prism coupling and end-face coupling methods were used to study the changes of optical waveguide properties under different annealing conditions. Considering the potential applications of low-loss waveguide structure in photoelectric sensors, electrical properties of (La, Sr)(Al, Ta)O 3 samples were studied as an important detection indicator of sensors.
期刊介绍：
The Journal of the Optical Society of America B (JOSA B) is a general optics research journal that complements JOSA A. It emphasizes scientific research on the fundamentals of the interaction of light with matter such as quantum optics, nonlinear optics, and laser physics. Topics include:
Advanced Instrumentation and Measurements
Fiber Optics and Fiber Lasers
Lasers and Other Light Sources from THz to XUV
Light-Induced Phenomena
Nonlinear and High Field Optics
Optical Materials
Optics Modes and Structured Light
Optomechanics
Metamaterials
Nanomaterials
Photonics and Semiconductor Optics
Physical Optics
Plasmonics
Quantum Optics and Entanglement
Quantum Key Distribution
Spectroscopy and Atomic or Molecular Optics
Superresolution and Advanced Imaging
Surface Optics
Ultrafast Optical Phenomena
Wave Guiding and Optical Confinement
JOSA B considers original research articles, feature issue contributions, invited reviews and tutorials, and comments on published articles.
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