Two Double-Node-Upset-Hardened Flip-Flop Designs for High-Performance Applications

IF 5.1 2区 计算机科学 Q1 COMPUTER SCIENCE, INFORMATION SYSTEMS IEEE Transactions on Emerging Topics in Computing Pub Date : 2023-09-25 DOI:10.1109/TETC.2023.3317070
Aibin Yan;Aoran Cao;Zhengfeng Huang;Jie Cui;Tianming Ni;Patrick Girard;Xiaoqing Wen;Jiliang Zhang
{"title":"Two Double-Node-Upset-Hardened Flip-Flop Designs for High-Performance Applications","authors":"Aibin Yan;Aoran Cao;Zhengfeng Huang;Jie Cui;Tianming Ni;Patrick Girard;Xiaoqing Wen;Jiliang Zhang","doi":"10.1109/TETC.2023.3317070","DOIUrl":null,"url":null,"abstract":"The continuous advancement of complementary metal-oxide-semiconductor technologies makes flip-flops (FFs) vulnerable to soft errors. Single-node upsets (SNUs), as well as double-node upsets (DNUs), are typical soft errors. This article proposes two radiation-hardened FF designs, namely DNU-tolerant FF (DUT-FF) and DNU-recoverable FF (DUR-FF). First, the DUT-FF which mainly consists of four dual-interlocked-storage-cells (DICEs) and three 2-input C-elements, is proposed. Then, to provide complete self-recovery from DNUs, the DUR-FF which mainly uses six interlocked DICEs is proposed. They have the following advantages: 1) They can completely protect against SNUs as well as DNUs; 2) the DUT-FF is cost-effective but the DUR-FF can provide complete self-recovery from any DNU. Simulations show the complete SNU/DNU tolerance of DUT-FF and the complete SNU/DNU self-recovery of DUR-FF but at the cost of indispensable area overhead when compared to the SNU hardened FFs. Besides, compared to the FFs of the same-type, the proposed FFs achieve a low delay making them suitable for high-performance applications.","PeriodicalId":13156,"journal":{"name":"IEEE Transactions on Emerging Topics in Computing","volume":null,"pages":null},"PeriodicalIF":5.1000,"publicationDate":"2023-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Transactions on Emerging Topics in Computing","FirstCategoryId":"94","ListUrlMain":"https://ieeexplore.ieee.org/document/10262220/","RegionNum":2,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"COMPUTER SCIENCE, INFORMATION SYSTEMS","Score":null,"Total":0}
引用次数: 0

Abstract

The continuous advancement of complementary metal-oxide-semiconductor technologies makes flip-flops (FFs) vulnerable to soft errors. Single-node upsets (SNUs), as well as double-node upsets (DNUs), are typical soft errors. This article proposes two radiation-hardened FF designs, namely DNU-tolerant FF (DUT-FF) and DNU-recoverable FF (DUR-FF). First, the DUT-FF which mainly consists of four dual-interlocked-storage-cells (DICEs) and three 2-input C-elements, is proposed. Then, to provide complete self-recovery from DNUs, the DUR-FF which mainly uses six interlocked DICEs is proposed. They have the following advantages: 1) They can completely protect against SNUs as well as DNUs; 2) the DUT-FF is cost-effective but the DUR-FF can provide complete self-recovery from any DNU. Simulations show the complete SNU/DNU tolerance of DUT-FF and the complete SNU/DNU self-recovery of DUR-FF but at the cost of indispensable area overhead when compared to the SNU hardened FFs. Besides, compared to the FFs of the same-type, the proposed FFs achieve a low delay making them suitable for high-performance applications.
查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
面向高性能应用的两种双节点升位硬化触发器设计
互补金属氧化物半导体技术的不断进步使得触发器(FF)很容易受到软误差的影响。单节点中断(SNU)和双节点中断(DNU)是典型的软误差。本文提出了两种抗辐射的 FF 设计,即 DNU 耐受 FF(DUT-FF)和 DNU 可恢复 FF(DUR-FF)。首先,提出了主要由四个双互锁存储单元(DICE)和三个双输入 C 元件组成的 DUT-FF。然后,为了提供 DNU 的完全自我恢复,提出了主要使用六个互锁 DICE 的 DUR-FF。它们具有以下优点1) 它们可以完全防止 SNU 和 DNU;2) DUT-FF 具有成本效益,但 DUR-FF 可以从任何 DNU 中提供完全的自我恢复。仿真结果表明,DUT-FF 具有完全的 SNU/DNU 耐受能力,DUR-FF 具有完全的 SNU/DNU 自我恢复能力,但与 SNU 加固型 FF 相比,DUT-FF 要以不可或缺的面积开销为代价。此外,与同类 FF 相比,所提出的 FF 具有较低的延迟,适合高性能应用。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
IEEE Transactions on Emerging Topics in Computing
IEEE Transactions on Emerging Topics in Computing Computer Science-Computer Science (miscellaneous)
CiteScore
12.10
自引率
5.10%
发文量
113
期刊介绍: IEEE Transactions on Emerging Topics in Computing publishes papers on emerging aspects of computer science, computing technology, and computing applications not currently covered by other IEEE Computer Society Transactions. Some examples of emerging topics in computing include: IT for Green, Synthetic and organic computing structures and systems, Advanced analytics, Social/occupational computing, Location-based/client computer systems, Morphic computer design, Electronic game systems, & Health-care IT.
期刊最新文献
Table of Contents Front Cover IEEE Transactions on Emerging Topics in Computing Information for Authors Special Section on Emerging Social Computing DALTON - Deep Local Learning in SNNs via local Weights and Surrogate-Derivative Transfer
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1