Si-Jun Kim, Won-Nyoung Jeong, Young-Seok Lee, You-Bin Seol, Chul-Hee Cho, In-Ho Seong, Min-Su Choi, Shin-Jae You
{"title":"Computational Study on the Parallel Double-Curling Probe for Multi-Site Electron Density Measurement in Low-Temperature Plasma","authors":"Si-Jun Kim, Won-Nyoung Jeong, Young-Seok Lee, You-Bin Seol, Chul-Hee Cho, In-Ho Seong, Min-Su Choi, Shin-Jae You","doi":"10.5757/asct.2023.32.5.127","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":8223,"journal":{"name":"Applied Science and Convergence Technology","volume":null,"pages":null},"PeriodicalIF":1.2000,"publicationDate":"2023-09-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Applied Science and Convergence Technology","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5757/asct.2023.32.5.127","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}