{"title":"Profilometry by zero-order interference fringe identification in the Commission Internationale de l’Eclairage system","authors":"Alexandra Plata Planidina, Carolina Mendoza Luna, Jáder Enrique Guerrero Bermúdez, Arturo Plata Gómez","doi":"10.1080/09500340.2023.2266049","DOIUrl":null,"url":null,"abstract":"AbstractIn this study, a numerical procedure is proposed to determine the optical contact (peak of the coherence function) in a scanning white light interferential microscope. The Red, Green and Blue image of the correlogram is transformed to the Commission Internationale de l’Eclairage chromatic system with x,y,z coordinates. The key element is to track the orientation of the curve (trajectory) which exhibits changes as it passes through the optical contact. The path described by the interferogram in this chromatic space makes it possible to localize, without ambiguity, the zero-order fringe and from this information to reconstruct the topography of an object of the order of a few tens of nanometres.KEYWORDS: Scanning white light interferometryCIExyz colour systemlow-coherence interferometrycolour CCD Disclosure statementNo potential conflict of interest was reported by the author(s).Additional informationFundingCML thanks Ministerio de Ciencia, Tecnología e Innovación (Minciencia-Colombia) for its financial support.","PeriodicalId":16426,"journal":{"name":"Journal of Modern Optics","volume":null,"pages":null},"PeriodicalIF":1.2000,"publicationDate":"2023-04-16","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Modern Optics","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/09500340.2023.2266049","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"OPTICS","Score":null,"Total":0}
引用次数: 0
Abstract
AbstractIn this study, a numerical procedure is proposed to determine the optical contact (peak of the coherence function) in a scanning white light interferential microscope. The Red, Green and Blue image of the correlogram is transformed to the Commission Internationale de l’Eclairage chromatic system with x,y,z coordinates. The key element is to track the orientation of the curve (trajectory) which exhibits changes as it passes through the optical contact. The path described by the interferogram in this chromatic space makes it possible to localize, without ambiguity, the zero-order fringe and from this information to reconstruct the topography of an object of the order of a few tens of nanometres.KEYWORDS: Scanning white light interferometryCIExyz colour systemlow-coherence interferometrycolour CCD Disclosure statementNo potential conflict of interest was reported by the author(s).Additional informationFundingCML thanks Ministerio de Ciencia, Tecnología e Innovación (Minciencia-Colombia) for its financial support.
期刊介绍:
The journal (under its former title Optica Acta) was founded in 1953 - some years before the advent of the laser - as an international journal of optics. Since then optical research has changed greatly; fresh areas of inquiry have been explored, different techniques have been employed and the range of application has greatly increased. The journal has continued to reflect these advances as part of its steadily widening scope.
Journal of Modern Optics aims to publish original and timely contributions to optical knowledge from educational institutions, government establishments and industrial R&D groups world-wide. The whole field of classical and quantum optics is covered. Papers may deal with the applications of fundamentals of modern optics, considering both experimental and theoretical aspects of contemporary research. In addition to regular papers, there are topical and tutorial reviews, and special issues on highlighted areas.
All manuscript submissions are subject to initial appraisal by the Editor, and, if found suitable for further consideration, to peer review by independent, anonymous expert referees.
General topics covered include:
• Optical and photonic materials (inc. metamaterials)
• Plasmonics and nanophotonics
• Quantum optics (inc. quantum information)
• Optical instrumentation and technology (inc. detectors, metrology, sensors, lasers)
• Coherence, propagation, polarization and manipulation (classical optics)
• Scattering and holography (diffractive optics)
• Optical fibres and optical communications (inc. integrated optics, amplifiers)
• Vision science and applications
• Medical and biomedical optics
• Nonlinear and ultrafast optics (inc. harmonic generation, multiphoton spectroscopy)
• Imaging and Image processing