Silicon molecular beam epitaxy

Yasuhiro Shiraki
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Abstract

Work on silicon molecular beam epitaxy (Si-MBE) is now growing on a worldwide scale and various aspects of this work are here reviewed. Basic studies on surface cleaning and defect evaluation have been conducted to improve epitaxy and homoepitaxy and doping have been certified to be comparable or exceed those of conventional CVB epitaxial layers. Formation of doping superlattices is a prime example demonstrating the potential of Si-MBE over conventional growth techniques. Heteroepitaxy including combinations such as silicon/insulator and silicon/metal (silicide) has become an active and growing field for both basic research and device development.

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硅分子束外延
硅分子束外延(Si-MBE)的研究正在世界范围内蓬勃发展,本文综述了硅分子束外延研究的各个方面。为了提高外延性能,已经进行了表面清洗和缺陷评价的基础研究,并且已经证明同外延和掺杂可以与传统的CVB外延层相媲美或超过。掺杂超晶格的形成是证明Si-MBE优于传统生长技术的潜力的一个主要例子。包括硅/绝缘体和硅/金属(硅化物)组合在内的异质外延已经成为基础研究和器件开发的一个活跃和不断发展的领域。
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Editorial Board Subject index Editorial Board Micromorphology of as-grown surfaces of crystals International School on Crystal Growth and Crystallographic Assessment of Industrial Materials
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