Ionization of CH4 under fast He-like Si-ion impact

IF 1.8 4区 物理与天体物理 Q2 SPECTROSCOPY Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2023-11-20 DOI:10.1016/j.elspec.2023.147405
Debasmita Chakraborty , Sanjeev Maurya , Laszlo Gulyás , Abhijit Bhogale , Chandan Bagdia , Nilesh Mhatre , Debashis Biswas , Lokesh C. Tribedi
{"title":"Ionization of CH4 under fast He-like Si-ion impact","authors":"Debasmita Chakraborty ,&nbsp;Sanjeev Maurya ,&nbsp;Laszlo Gulyás ,&nbsp;Abhijit Bhogale ,&nbsp;Chandan Bagdia ,&nbsp;Nilesh Mhatre ,&nbsp;Debashis Biswas ,&nbsp;Lokesh C. Tribedi","doi":"10.1016/j.elspec.2023.147405","DOIUrl":null,"url":null,"abstract":"<div><p>We have studied the absolute double differential cross section (DDCS) of electrons ejected from the methane molecule (CH<span><math><msub><mrow></mrow><mrow><mn>4</mn></mrow></msub></math></span>) under the impact of highly charged fast projectile ions. The energy and angular distributions of electrons have been measured in interactions with 70 MeV Si<span><math><msup><mrow></mrow><mrow><mn>12</mn><mo>+</mo></mrow></msup></math></span><span> ions. These DDCS data together with the derived single differential cross sections and the total cross section (TCS) have been compared with predictions of the continuum distorted wave-eikonal initial state model using different approaches for the molecular orbitals<span>. It has been found that the theories overestimate the measured DDCS values at low ejection energies, which may indicate shortcomings of the model in the case of strong perturbation. At the same time, applying the model to a previous measurement using fast C ions having a lower perturbation strength, excellent agreements have been obtained with the experimental data. Considering the scaling properties, the available TCS data have been plotted with a scaled parameter, namely the perturbation strength, q/v (where q= charge state, v=velocity of the projectile). The KLL Auger e-emission as well as the KLL hyper-satellite peaks are analyzed for different emission angles. The double K-vacancy production shows a considerable enhancement i.e. 37% of the single production cross section which is consistent with some of the recent experiments on K-ionization using x-ray techniques.</span></span></p></div>","PeriodicalId":15726,"journal":{"name":"Journal of Electron Spectroscopy and Related Phenomena","volume":"269 ","pages":"Article 147405"},"PeriodicalIF":1.8000,"publicationDate":"2023-11-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Electron Spectroscopy and Related Phenomena","FirstCategoryId":"101","ListUrlMain":"https://www.sciencedirect.com/science/article/pii/S0368204823001226","RegionNum":4,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q2","JCRName":"SPECTROSCOPY","Score":null,"Total":0}
引用次数: 0

Abstract

We have studied the absolute double differential cross section (DDCS) of electrons ejected from the methane molecule (CH4) under the impact of highly charged fast projectile ions. The energy and angular distributions of electrons have been measured in interactions with 70 MeV Si12+ ions. These DDCS data together with the derived single differential cross sections and the total cross section (TCS) have been compared with predictions of the continuum distorted wave-eikonal initial state model using different approaches for the molecular orbitals. It has been found that the theories overestimate the measured DDCS values at low ejection energies, which may indicate shortcomings of the model in the case of strong perturbation. At the same time, applying the model to a previous measurement using fast C ions having a lower perturbation strength, excellent agreements have been obtained with the experimental data. Considering the scaling properties, the available TCS data have been plotted with a scaled parameter, namely the perturbation strength, q/v (where q= charge state, v=velocity of the projectile). The KLL Auger e-emission as well as the KLL hyper-satellite peaks are analyzed for different emission angles. The double K-vacancy production shows a considerable enhancement i.e. 37% of the single production cross section which is consistent with some of the recent experiments on K-ionization using x-ray techniques.

查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
类氦硅离子快速冲击下CH4的电离
本文研究了甲烷分子(CH4)在高电荷快速抛射离子的冲击下所发射出的电子的绝对双微分截面(DDCS)。在与70 MeV Si12+离子的相互作用中,测量了电子的能量和角分布。这些DDCS数据以及推导出的单微分截面和总截面(TCS)与使用不同方法对分子轨道的连续体畸变波-斜向初始状态模型的预测结果进行了比较。在低抛射能量下,理论高估了测量的DDCS值,这可能表明模型在强摄动情况下的缺陷。同时,将该模型应用于先前使用微扰强度较低的快C离子进行的测量,得到了与实验数据非常吻合的结果。考虑到标度特性,可用TCS数据用标度参数,即扰动强度q/v(其中q=电荷状态,v=弹丸速度)绘制。分析了不同发射角度下的KLL俄歇电子发射和KLL超卫星峰。双k空位产生显示出相当大的增强,即单产生截面的37%,这与最近使用x射线技术进行k电离的一些实验一致。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
CiteScore
3.30
自引率
5.30%
发文量
64
审稿时长
60 days
期刊介绍: The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.
期刊最新文献
Atomic data, and ionization cross-sections by electron impact of tungsten ions, W LXV Elucidating the structure of amorphous-carbon films containing carbide and non-carbide-forming metals Editorial Board Polarization measurement of vacuum ultraviolet light using visible fluorescence from neon atoms Comparison of soft X-ray spectro-ptychography and scanning transmission X-ray microscopy
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1