Calibration of Imaging Plates for Detecting Charged Particles

IF 0.4 4区工程技术 Q4 ENGINEERING, MULTIDISCIPLINARY Instruments and Experimental Techniques Pub Date : 2023-12-04 DOI:10.1134/S0020441223050299

A. O. Khurchiev, V. A. Panyushkin, A. V. Skoblyakov, A. V. Kantsyrev, A. A. Golubev, R. O. Gavrilin, A. V. Bogdanov, E. M. Ladygina, S. A. Vysotskii

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Abstract

Information about charged particles emitted by plasma of high-current discharges is of interest both from the point of view of understanding the fundamental processes occurring in pulsed plasma and for applied problems. Compact magnetic spectrometers based on permanent magnets make it possible to measure the flux of charged particles from a plasma under conditions of strong electromagnetic noise. Imaging plates (IP) are one of the most commonly used types of detectors for detecting charged particles in laser-plasma and electric-discharge experiments. This paper presents the results of calibration of the BAS-MS IP when detecting electrons and the BAS-TR IP when detecting helium and tungsten ions. Calibration dependences of the sensitivity of the BAS-MS IP for electrons in the energy range of 0.65–50 MeV and the sensitivity of the BAS-TR IP for tungsten ions in the energy range from 20 eV to 650 keV are obtained, taking into account the angles of incidence of particles on the detector.

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校准用于探测带电粒子的成像板

从了解脉冲等离子体的基本过程和解决应用问题的角度来看，有关大电流放电等离子体发射的带电粒子的信息都很有意义。基于永磁体的紧凑型磁谱仪可以在强电磁噪声条件下测量来自等离子体的带电粒子通量。成像板（IP）是激光等离子体和放电实验中探测带电粒子最常用的探测器类型之一。本文介绍了 BAS-MS IP（探测电子）和 BAS-TR IP（探测氦离子和钨离子）的校准结果。考虑到粒子在探测器上的入射角度，得出了 BAS-MS IP 在 0.65-50 MeV 能量范围内对电子的灵敏度和 BAS-TR IP 在 20 eV 至 650 keV 能量范围内对钨离子的灵敏度的校准相关性。

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来源期刊

Instruments and Experimental Techniques 工程技术-工程：综合

CiteScore

1.20

自引率

33.30%

发文量

113

审稿时长

4-8 weeks

期刊介绍： Instruments and Experimental Techniques is an international peer reviewed journal that publishes reviews describing advanced methods for physical measurements and techniques and original articles that present techniques for physical measurements, principles of operation, design, methods of application, and analysis of the operation of physical instruments used in all fields of experimental physics and when conducting measurements using physical methods and instruments in astronomy, natural sciences, chemistry, biology, medicine, and ecology.