Effect of sample carriers on analytical parameters in total reflection X-ray fluorescence - a tool for multi-trace elemental analysis

IF 1.1 4区化学 Q3 SPECTROSCOPY Spectroscopy Letters Pub Date : 2023-11-27 DOI:10.1080/00387010.2023.2285912

Manjunatha, A. S. Bennal, N. M. Badiger, H. Stosnach, M. Y. Kariduraganavar

引用次数: 0

Abstract

The Total reflection X-ray Fluorescence technique is increasingly popular for its simplicity and rapid elemental screening. This study evaluates the various analytical parameters including spectros...

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样品载体对多痕量元素全反射x射线荧光分析参数的影响

全反射x射线荧光技术因其简单、快速的元素筛选而越来越受欢迎。本研究评估了各种分析参数，包括光谱…

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来源期刊

Spectroscopy Letters 物理-光谱学

CiteScore

2.90

自引率

5.90%

发文量

审稿时长

1.3 months

期刊介绍： Spectroscopy Letters provides vital coverage of all types of spectroscopy across all the disciplines where they are used—including novel work in fundamental spectroscopy, applications, diagnostics and instrumentation. The audience is intended to be all practicing spectroscopists across all scientific (and some engineering) disciplines, including: physics, chemistry, biology, instrumentation science, and pharmaceutical science.

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