Influence of reference sphere on test accuracy of Ritchey–Common method

IF 2.3 4区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Iet Optoelectronics Pub Date : 2024-01-16 DOI:10.1049/ote2.12110
Shuo Zhu, Xiaohui Zhang
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Abstract

The authors analyse the influence of reference sphere on the test accuracy of Ritchey–Common method during testing of flat mirror surface. A simulation model is established to simulate the influence of different radii of curvature of reference sphere on system wavefront. Then, the difference between the flat mirror surface result with reference sphere surface error to the actual flat mirror surface is examined by this model. The test accuracy of flat mirror result can be effectively improved by eliminating the influence of the surface error of reference sphere. When the surface accuracy of the reference sphere is better than 0.01 λ, the influence on RMS test accuracy is within 0.01 λ. R–C test path is built to test a 100 mm-diameter flat mirror surface, and its results are compared with those of the flat mirror surface without surface error of reference sphere and with the test result of the interferometer. When the surface accuracy of the actual used area of reference sphere is better than 0.01 λ, the effect on flat mirror RMS accuracy is within 0.01 λ. The RMS test accuracy can reach 0.01 λ, when the surface error of reference sphere is retained. The experiment verifies the correctness of the simulation results and guarantees the improvement in the test accuracy of R–C method.

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参考球对里奇-康普法测试精度的影响
作者分析了在测试平面镜面时参考球对 Ritchey-Common 方法测试精度的影响。建立了一个仿真模型来模拟参考球不同曲率半径对系统波面的影响。然后,利用该模型检验参考球面误差的平面镜面结果与实际平面镜面之间的差异。通过消除参考球表面误差的影响,可以有效提高平面镜结果的测试精度。当参考球表面精度优于 0.01 λ 时,对有效值测试精度的影响在 0.01 λ 以内。建立 R-C 测试路径来测试直径为 100 mm 的平面镜面,并将其结果与无参考球表面误差的平面镜面以及干涉仪的测试结果进行比较。当参考球实际使用面积的表面精度优于 0.01 λ 时,对平面镜有效值精度的影响在 0.01 λ 以内。实验验证了仿真结果的正确性,保证了 R-C 方法测试精度的提高。
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来源期刊
Iet Optoelectronics
Iet Optoelectronics 工程技术-电信学
CiteScore
4.50
自引率
0.00%
发文量
26
审稿时长
6 months
期刊介绍: IET Optoelectronics publishes state of the art research papers in the field of optoelectronics and photonics. The topics that are covered by the journal include optical and optoelectronic materials, nanophotonics, metamaterials and photonic crystals, light sources (e.g. LEDs, lasers and devices for lighting), optical modulation and multiplexing, optical fibres, cables and connectors, optical amplifiers, photodetectors and optical receivers, photonic integrated circuits, photonic systems, optical signal processing and holography and displays. Most of the papers published describe original research from universities and industrial and government laboratories. However correspondence suggesting review papers and tutorials is welcomed, as are suggestions for special issues. IET Optoelectronics covers but is not limited to the following topics: Optical and optoelectronic materials Light sources, including LEDs, lasers and devices for lighting Optical modulation and multiplexing Optical fibres, cables and connectors Optical amplifiers Photodetectors and optical receivers Photonic integrated circuits Nanophotonics and photonic crystals Optical signal processing Holography Displays
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