Jie Deng, C. Pei, Yuange Zhang, Yinqiang Qu, Ke Deng, Hong-en Chen, Zhenmao Chen
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引用次数: 0
Abstract
It is necessary to detect subsurface defects for a key metallic structural component especially a multilayer coating to ensure its structural integrity. In this paper, an imaging algorithm using the synthetic aperture focusing technique (SAFT) is developed for processing surface wave signals of array pickup electromagnetic acoustic transducer (EMAT) to improve its signal-to-noise ratio and detectability of subsurface defects. In addition, an array pickup unit of surface wave EMAT with gap configuration is proposed to receive multi-channel surface wave signals and is optimized by adjusting its coil configuration such as number, spacing and detection distance in order to obtain better SAFT imaging result. Both simulation and measured EMAT surface wave signals are used for the defect imaging and all the results verified the validity and the efficiency of the proposed method.
期刊介绍：
The aim of the International Journal of Applied Electromagnetics and Mechanics is to contribute to intersciences coupling applied electromagnetics, mechanics and materials. The journal also intends to stimulate the further development of current technology in industry. The main subjects covered by the journal are:
Physics and mechanics of electromagnetic materials and devices
Computational electromagnetics in materials and devices
Applications of electromagnetic fields and materials
The three interrelated key subjects – electromagnetics, mechanics and materials - include the following aspects: electromagnetic NDE, electromagnetic machines and devices, electromagnetic materials and structures, electromagnetic fluids, magnetoelastic effects and magnetosolid mechanics, magnetic levitations, electromagnetic propulsion, bioelectromagnetics, and inverse problems in electromagnetics.
The editorial policy is to combine information and experience from both the latest high technology fields and as well as the well-established technologies within applied electromagnetics.
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