A novel approach for one-step defect detection and depth estimation using sequenced thermal signal encoding
Wang Zheng, Siyan Zhang, Akam M. Omer, Zhuoqiao Wu, Ning Tao, Cunlin Zhang, Dazhi Yang, Hai Zhang, Qiang Fang, Xavier Maldague, Jianqiao Meng, Yuxia Duan
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