HAXPES reference spectra of UO2 generated with Ga Kα x-ray source

IF 1.6 Q3 PHYSICS, CONDENSED MATTER Surface Science Spectra Pub Date : 2024-01-12 DOI:10.1116/6.0003057
Stuart A. Dunn, Aaron Wood, Paul Roussel, B. Spencer, Robert Harrison, Philip Kaye, Matthew A. Higginson
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Abstract

HAXPES measurements were carried out using a Scienta Omicron HAXPES instrument to provide reference spectra for depleted uranium dioxide. High purity uranium dioxide, as confirmed by trace elemental analysis and x-ray diffraction, was synthesized via the integrated dry route from uranium hexafluoride. The material was fixed on double sided carbon tape for the analysis with charge control measures in place. The expanded energy range, using a Ga Kα x-ray source, presents core level photoelectrons not observed in traditional XPS. In addition, a region associated with the x-ray induced Auger transitions MNN is evident at binding energies only achievable with HAXPES. The reference spectra presented here act as the first in a line of proposed investigations into the comparison of XPS and HAXPES from surface to bulk as well as a fundamental understanding of the electronic structure of uranium materials.
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用 Ga Kα X 射线源生成的二氧化钛 HAXPES 参考光谱
使用 Scienta Omicron HAXPES 仪器进行了 HAXPES 测量,以提供贫化二氧化铀的参考光谱。经痕量元素分析和 X 射线衍射确认的高纯度二氧化铀是通过六氟化铀的综合干法路线合成的。材料被固定在双面碳带上进行分析,并采取了电荷控制措施。利用 Ga Kα X 射线源,扩大了能量范围,呈现出传统 XPS 无法观察到的核心级光电子。此外,与 X 射线诱导的奥杰跃迁 MNN 相关的区域在 HAXPES 才能达到的结合能上也很明显。这里展示的参考光谱是 XPS 和 HAXPES 从表面到块体对比研究的第一部分,也是从根本上了解铀材料电子结构的第一步。
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来源期刊
Surface Science Spectra
Surface Science Spectra PHYSICS, CONDENSED MATTER-
CiteScore
1.90
自引率
7.70%
发文量
36
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