{"title":"Correction: Switching performance assessment of gate-all-around InAs-Si vertical TFET with triple metal gate, a simulation study.","authors":"Dariush Madadi, Saeed Mohammadi","doi":"10.1186/s11671-024-03968-z","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":72828,"journal":{"name":"Discover nano","volume":"19 1","pages":"26"},"PeriodicalIF":0.0000,"publicationDate":"2024-02-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC10861417/pdf/","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Discover nano","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1186/s11671-024-03968-z","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"0","JCRName":"MATERIALS SCIENCE, MULTIDISCIPLINARY","Score":null,"Total":0}
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