Prediction of 4D stress field evolution around additive manufacturing-induced porosity through progressive deep-learning frameworks

M. Rezasefat, James D. Hogan
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Abstract

This study investigates the application of machine learning models to predict time-evolving stress fields in complex three-dimensional structures trained with full-scale finite element simulation data. Two novel architectures, the Multi-Decoder CNN (MUDE-CNN) and the Multiple Encoder-Decoder Model with Transfer Learning (MTED-TL), were introduced to address the challenge of predicting the progressive and spatial evolutional of stress distributions around defects. The MUDE-CNN leveraged a shared encoder for simultaneous feature extraction and employed multiple decoders for distinct time frame predictions, while MTED-TL progressively transferred knowledge from one encoder-decoder block to another, thereby enhancing prediction accuracy through transfer learning. These models were evaluated to assess their accuracy, with a particular focus on predicting temporal stress fields around an additive manufacturing-induced isolated pore, as understanding such defects is crucial for assessing mechanical properties and structural integrity in materials and components fabricated via additive manufacturing. The temporal model evaluation demonstrated MTED-TL's consistent superiority over MUDE-CNN, owing to transfer learning's advantageous initialization of weights and smooth loss curves. Furthermore, an autoregressive training framework was introduced to improve temporal predictions, consistently outperforming both MUDE-CNN and MTED-TL. By accurately predicting temporal stress fields around AM-induced defects, these models can enable real-time monitoring and proactive defect mitigation during the fabrication process. This capability ensures enhanced component quality and enhances the overall reliability of additively manufactured parts.
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通过渐进式深度学习框架预测添加剂制造引起的孔隙周围的 4D 应力场演化
本研究探讨了如何应用机器学习模型来预测使用全尺寸有限元模拟数据训练的复杂三维结构中随时间变化的应力场。研究引入了两种新型架构,即多解码器 CNN(MUDE-CNN)和带迁移学习的多编码器-解码器模型(MTED-TL),以应对预测缺陷周围应力分布的渐进和空间演变这一挑战。MUDE-CNN 利用共享编码器进行同步特征提取,并采用多个解码器进行不同时间框架的预测,而 MTED-TL 则将知识从一个编码器-解码器块逐步转移到另一个编码器-解码器块,从而通过迁移学习提高预测精度。对这些模型进行了评估,以评估其准确性,重点是预测增材制造引起的孤立孔隙周围的时间应力场,因为了解此类缺陷对于评估通过增材制造制造的材料和部件的机械性能和结构完整性至关重要。时态模型评估表明,MTED-TL 始终优于 MUDE-CNN,这得益于迁移学习在权重初始化和平滑损失曲线方面的优势。此外,还引入了一个自回归训练框架来改进时间预测,其性能始终优于 MUDE-CNN 和 MTED-TL。通过准确预测 AM 引起的缺陷周围的时间应力场,这些模型可以在制造过程中实现实时监控和主动缺陷缓解。这种能力可确保提高部件质量,并增强快速成型部件的整体可靠性。
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