{"title":"Two-Dimensional Visible Synchrotron Radiation Interferometry for Measuring Transverse Beam-Profile at HLS-II","authors":"Sanshuang Jin, Yunkun Zhao, Ruizhe Wu, Fangfang Wu, Tianyu Zhou, Baogen Sun, Jigang Wang","doi":"10.1109/MIM.2024.10423656","DOIUrl":null,"url":null,"abstract":"Accurate measurement of the transverse beam-profile is critical to analyzing the performance of the electron storage ring light sources. In this paper, a two-dimensional interferometer using the spatial coherence of the synchrotron radiation is developed to measure the transverse beam-profile of Hefei Light Source-II (HLS-II). On the B7 beamline, the transverse beam-profile of this light source point was measured by the interference fringes of Synchrotron Radiation (SR) with wavelength of 500 nm. Under the normal top-off operation mode of HLS-II, the horizontal and vertical beam sizes measured by the interferometer are $291.9\\pm 1.6\\ \\mu\\mathrm{m}$ and $241.3\\pm 0.9\\ \\mu\\mathrm{m}$, respectively. At the same time, the effect of beam intensity on the transverse beam-profile was also investigated. The interferometer measurement system we designed satisfies the real-time online monitoring of the transverse beam-profile in the top-off operation mode of HLS-II.","PeriodicalId":55025,"journal":{"name":"IEEE Instrumentation & Measurement Magazine","volume":null,"pages":null},"PeriodicalIF":1.6000,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"IEEE Instrumentation & Measurement Magazine","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.1109/MIM.2024.10423656","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Accurate measurement of the transverse beam-profile is critical to analyzing the performance of the electron storage ring light sources. In this paper, a two-dimensional interferometer using the spatial coherence of the synchrotron radiation is developed to measure the transverse beam-profile of Hefei Light Source-II (HLS-II). On the B7 beamline, the transverse beam-profile of this light source point was measured by the interference fringes of Synchrotron Radiation (SR) with wavelength of 500 nm. Under the normal top-off operation mode of HLS-II, the horizontal and vertical beam sizes measured by the interferometer are $291.9\pm 1.6\ \mu\mathrm{m}$ and $241.3\pm 0.9\ \mu\mathrm{m}$, respectively. At the same time, the effect of beam intensity on the transverse beam-profile was also investigated. The interferometer measurement system we designed satisfies the real-time online monitoring of the transverse beam-profile in the top-off operation mode of HLS-II.
期刊介绍：
IEEE Instrumentation & Measurement Magazine is a bimonthly publication. It publishes in February, April, June, August, October, and December of each year. The magazine covers a wide variety of topics in instrumentation, measurement, and systems that measure or instrument equipment or other systems. The magazine has the goal of providing readable introductions and overviews of technology in instrumentation and measurement to a wide engineering audience. It does this through articles, tutorials, columns, and departments. Its goal is to cross disciplines to encourage further research and development in instrumentation and measurement.
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