{"title":"Study on the evolution law and microstructures of melted marks of H59 brass conductor under overcurrent failure","authors":"Xiaobo Yan, yongfeng Zhang, Liyin Cao, Hao Huang, Renlie Bao, Cheng Hu, An Luo, Xin Lv","doi":"10.1117/12.3016333","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":517195,"journal":{"name":"Fifth International Conference on Optoelectronic Science and Materials (ICOSM 2023)","volume":"22 7","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Fifth International Conference on Optoelectronic Science and Materials (ICOSM 2023)","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.3016333","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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