{"title":"A depth-variant seismic wavelet extraction method for basis pursuit inversion with impedance trend constraint","authors":"R. Cai, Chengyu Sun, Zhen’an Yao, Shizhong Li","doi":"10.1190/geo2023-0255.1","DOIUrl":null,"url":null,"abstract":"The seismic images produced by pre-stack depth migration show more accurate subsurface structures than time images, resulting in a growing need for depth-domain inversion. However, due to the strong non-stationarity exhibited by depth-domain seismic data, time-domain inversion methods based on the convolutional model cannot be directly applied in the depth domain. To address this issue, we have developed a method for extracting a depth-variant seismic wavelet, which is then combined with a non-stationary convolutional model to enable direct inversion of the depth-domain acoustic impedance. First, we extend the Morlet wavelet to the depth domain and propose an orthogonal matching pursuit spectral decomposition method using the depth-domain Morlet wavelet. We then investigate the waveforms and wavenumber spectra similarities between the depth-domain Morlet wavelet and depth-domain Ricker wavelet and extract depth-variant Ricker wavelets from the depth-wavenumber spectrum. We add a depth-domain impedance trend constraint to the conventional basis pursuit inversion to enhance the lateral continuity of the inversion results. Then, we attain direct inversion of the depth-domain acoustic impedance. Tests of synthetic and field data demonstrate that the proposed method achieves high-accuracy inversion results while maintaining high computational efficiency, highlighting our approach's effectiveness and strong reservoir characterization potential.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"28 7","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-02-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"89","ListUrlMain":"https://doi.org/10.1190/geo2023-0255.1","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
The seismic images produced by pre-stack depth migration show more accurate subsurface structures than time images, resulting in a growing need for depth-domain inversion. However, due to the strong non-stationarity exhibited by depth-domain seismic data, time-domain inversion methods based on the convolutional model cannot be directly applied in the depth domain. To address this issue, we have developed a method for extracting a depth-variant seismic wavelet, which is then combined with a non-stationary convolutional model to enable direct inversion of the depth-domain acoustic impedance. First, we extend the Morlet wavelet to the depth domain and propose an orthogonal matching pursuit spectral decomposition method using the depth-domain Morlet wavelet. We then investigate the waveforms and wavenumber spectra similarities between the depth-domain Morlet wavelet and depth-domain Ricker wavelet and extract depth-variant Ricker wavelets from the depth-wavenumber spectrum. We add a depth-domain impedance trend constraint to the conventional basis pursuit inversion to enhance the lateral continuity of the inversion results. Then, we attain direct inversion of the depth-domain acoustic impedance. Tests of synthetic and field data demonstrate that the proposed method achieves high-accuracy inversion results while maintaining high computational efficiency, highlighting our approach's effectiveness and strong reservoir characterization potential.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
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