{"title":"Dependence of Reversible and Irreversible Failures of Semiconductor Devices on the Repetition Rate of Powerful Pulse Electromagnetic Interferences","authors":"","doi":"10.1134/s1064226923120197","DOIUrl":null,"url":null,"abstract":"<span> <h3>Abstract</h3> <p>Mechanisms of reversible and irreversible failures that occur in microwave semiconductor devices, microcircuits, and microprocessors under the impact of powerful electromagnetic pulses, either single or periodic, are analyzed. It is shown that, in microprocessors, failures of both types are generated by the electrothermal instabilities, being developed within negligibly small volumes of a device. The dependences of the threshold energy of failures on the pulse amplitude, duration, and repetition rate are explained. The results of the calculation are consistent with the experimental data.</p> </span>","PeriodicalId":50229,"journal":{"name":"Journal of Communications Technology and Electronics","volume":null,"pages":null},"PeriodicalIF":0.4000,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Communications Technology and Electronics","FirstCategoryId":"94","ListUrlMain":"https://doi.org/10.1134/s1064226923120197","RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
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Abstract
Mechanisms of reversible and irreversible failures that occur in microwave semiconductor devices, microcircuits, and microprocessors under the impact of powerful electromagnetic pulses, either single or periodic, are analyzed. It is shown that, in microprocessors, failures of both types are generated by the electrothermal instabilities, being developed within negligibly small volumes of a device. The dependences of the threshold energy of failures on the pulse amplitude, duration, and repetition rate are explained. The results of the calculation are consistent with the experimental data.
期刊介绍：
Journal of Communications Technology and Electronics is a journal that publishes articles on a broad spectrum of theoretical, fundamental, and applied issues of radio engineering, communication, and electron physics. It publishes original articles from the leading scientific and research centers. The journal covers all essential branches of electromagnetics, wave propagation theory, signal processing, transmission lines, telecommunications, physics of semiconductors, and physical processes in electron devices, as well as applications in biology, medicine, microelectronics, nanoelectronics, electron and ion emission, etc.
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