{"title":"Demonstration of the propagation of errors using resistors","authors":"K. Gan","doi":"10.1119/5.0145005","DOIUrl":null,"url":null,"abstract":"We present a simple experiment to demonstrate the concept of propagation of errors by measuring resistors on printed circuit boards (PCBs). We devise a method for connecting the resistors on a PCB that allows a relatively quick measurement of 200 resistor pairs to show that the distributions of the measurement of individual resistances, as well as the total resistance, are Gaussian-distributed, as expected from the central limit theorem. The measurement demonstrates how individual uncertainties propagate to the total uncertainty. The experiment is part of a laboratory course on statistics for physics students that emphasizes the application of statistics in data analysis.","PeriodicalId":0,"journal":{"name":"","volume":"112 5","pages":""},"PeriodicalIF":0.0,"publicationDate":"2024-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"","FirstCategoryId":"101","ListUrlMain":"https://doi.org/10.1119/5.0145005","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
引用次数: 0
Abstract
We present a simple experiment to demonstrate the concept of propagation of errors by measuring resistors on printed circuit boards (PCBs). We devise a method for connecting the resistors on a PCB that allows a relatively quick measurement of 200 resistor pairs to show that the distributions of the measurement of individual resistances, as well as the total resistance, are Gaussian-distributed, as expected from the central limit theorem. The measurement demonstrates how individual uncertainties propagate to the total uncertainty. The experiment is part of a laboratory course on statistics for physics students that emphasizes the application of statistics in data analysis.