Predicting the coupling of HPEM waveform with a power amplifier in perforated conductive enclosure using FDDM/VF

IF 1.4 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Iet Science Measurement & Technology Pub Date : 2024-03-15 DOI:10.1049/smt2.12189
Ali Kalantarnia, Abdollah Mirzabeigi
{"title":"Predicting the coupling of HPEM waveform with a power amplifier in perforated conductive enclosure using FDDM/VF","authors":"Ali Kalantarnia,&nbsp;Abdollah Mirzabeigi","doi":"10.1049/smt2.12189","DOIUrl":null,"url":null,"abstract":"<p>One of the most common methods to protect electronic and telecommunication systems in a high-power electromagnetic (HPEM) environment is using a conductive enclosure. Amplifiers are the vital parts in transmitter and receiver systems as the main components of a telecommunication system, so investigating the effects of HPEM waveform on their performance is very important. The Presence of apertures in the body of the conductive enclosure, as well as non-linear elements such as transistors in amplifiers, adds to the complexity of examining the coupling of electromagnetic fields on the performance of amplifiers. Considering the importance of the topic, in this study, the impact of the HPEM waveform on the power amplifier inside the conductive enclosure has been investigated. By using the finite difference delay modelling (FDDM) numerical method as a stable method followed by the vector fitting (VF) method, the electromagnetic problem has become a circuit problem, which allows examining the response of the power amplifier and any circuit, including non-linear elements against the interference field. Responses of bipolar linear and non-linear components in the perforated conductive enclosure by the proposed method have been compared with the results obtained by computer simulation technology microwave studio (CST-MWS) for verification.</p>","PeriodicalId":54999,"journal":{"name":"Iet Science Measurement & Technology","volume":"18 8","pages":"429-442"},"PeriodicalIF":1.4000,"publicationDate":"2024-03-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://onlinelibrary.wiley.com/doi/epdf/10.1049/smt2.12189","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Iet Science Measurement & Technology","FirstCategoryId":"5","ListUrlMain":"https://onlinelibrary.wiley.com/doi/10.1049/smt2.12189","RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q3","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0

Abstract

One of the most common methods to protect electronic and telecommunication systems in a high-power electromagnetic (HPEM) environment is using a conductive enclosure. Amplifiers are the vital parts in transmitter and receiver systems as the main components of a telecommunication system, so investigating the effects of HPEM waveform on their performance is very important. The Presence of apertures in the body of the conductive enclosure, as well as non-linear elements such as transistors in amplifiers, adds to the complexity of examining the coupling of electromagnetic fields on the performance of amplifiers. Considering the importance of the topic, in this study, the impact of the HPEM waveform on the power amplifier inside the conductive enclosure has been investigated. By using the finite difference delay modelling (FDDM) numerical method as a stable method followed by the vector fitting (VF) method, the electromagnetic problem has become a circuit problem, which allows examining the response of the power amplifier and any circuit, including non-linear elements against the interference field. Responses of bipolar linear and non-linear components in the perforated conductive enclosure by the proposed method have been compared with the results obtained by computer simulation technology microwave studio (CST-MWS) for verification.

Abstract Image

查看原文
分享 分享
微信好友 朋友圈 QQ好友 复制链接
本刊更多论文
使用 FDDM/VF 预测穿孔导电外壳中 HPEM 波形与功率放大器的耦合情况
在高功率电磁(HPEM)环境中保护电子和电信系统的最常用方法之一是使用导电外壳。放大器是发射器和接收器系统中的重要部件,是电信系统的主要组件,因此研究 HPEM 波形对其性能的影响非常重要。导电外壳主体上的孔隙以及放大器中的晶体管等非线性元件增加了研究电磁场耦合对放大器性能影响的复杂性。考虑到这一课题的重要性,本研究调查了 HPEM 波形对导电外壳内功率放大器的影响。通过使用有限差分延迟建模(FDDM)数值方法作为稳定方法,再使用矢量拟合(VF)方法,将电磁问题转化为电路问题,从而可以研究功率放大器和任何电路(包括非线性元件)对干扰场的响应。利用所提出的方法计算的双极线性和非线性元件在穿孔导电外壳中的响应与计算机仿真技术微波工作室(CST-MWS)获得的结果进行了比较,以进行验证。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
求助全文
约1分钟内获得全文 去求助
来源期刊
Iet Science Measurement & Technology
Iet Science Measurement & Technology 工程技术-工程:电子与电气
CiteScore
4.30
自引率
7.10%
发文量
41
审稿时长
7.5 months
期刊介绍: IET Science, Measurement & Technology publishes papers in science, engineering and technology underpinning electronic and electrical engineering, nanotechnology and medical instrumentation.The emphasis of the journal is on theory, simulation methodologies and measurement techniques. The major themes of the journal are: - electromagnetism including electromagnetic theory, computational electromagnetics and EMC - properties and applications of dielectric, magnetic, magneto-optic, piezoelectric materials down to the nanometre scale - measurement and instrumentation including sensors, actuators, medical instrumentation, fundamentals of measurement including measurement standards, uncertainty, dissemination and calibration Applications are welcome for illustrative purposes but the novelty and originality should focus on the proposed new methods.
期刊最新文献
Research on Arc Ignition Characteristics of Cables’ Insulation Under Different Temperatures Considering Thickness Simulation of electric field distribution of gas insulated switchgear considering metal tip defect locations and structural parameters Long Short-Term Memory Network for Co-Frequency Co-Time Full-Duplex Digital Domain Interference Suppression Self-balancing 20 Hz current comparator Efficient hysteresis characterization and prediction in 3D-printed magnetic materials using deep learning
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
已复制链接
已复制链接
快去分享给好友吧!
我知道了
×
扫码分享
扫码分享
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1