{"title":"Research on sector scanning imaging technology of EMAT for through-hole defects in aluminium plates","authors":"Zhichao Cai, Zhengshi Lu, Yihu Sun, Jianfen Wang","doi":"10.1080/10589759.2024.2326859","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":508643,"journal":{"name":"Nondestructive Testing and Evaluation","volume":"2 15","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-03-07","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Nondestructive Testing and Evaluation","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1080/10589759.2024.2326859","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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