How to measure the current-voltage characteristics of Ohmic conductors and superconductors

P. Romano
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Abstract

A comparison between two different techniques useful to measure the current-voltage (I-V) characteristics of conducting materials or devices will be presented, suitable for an undergraduate laboratory devoted to the electrical measurements. First, I-V curves of linear resistors with known nominal resistance are measured by using the simplest version of a DC method and an AC method, in order to settle the experimental procedure. Then, nonlinear I-V curves of a superconductor are measured with the same procedures at different temperatures down to 77K.
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如何测量欧姆导体和超导体的电流-电压特性
本章将对测量导电材料或器件的电流-电压(I-V)特性的两种不同技术进行比较,这两种技术都适用于专门进行电学测量的本科生实验室。首先,使用最简单的直流法和交流法测量已知标称电阻的线性电阻器的 I-V 曲线,以确定实验程序。然后,在不同温度(低至 77K)下使用相同的程序测量超导体的非线性 I-V 曲线。
本文章由计算机程序翻译,如有差异,请以英文原文为准。
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