Effect of template on the photoresponsivity of BaSi2 films grown on Ge(111) substrates by molecular beam epitaxy

S. Aonuki, Kaori Takayanagi, Ai Iwai, K. Toko, T. Suemasu
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Abstract

Epitaxial growth of BaSi2 films on Si(111) has demonstrated that the BaSi2 template can serve as a seed crystal for BaSi2 overlayers by molecular beam epitaxy (MBE) and shows high photoresponsivity, but not yet on Ge(111) substrates. We have investigated the effect of various templates on the photoresponsivity of BaSi2 films grown on Ge(111) substrates. Samples with MBE-grown templates exhibited high a-axis orientation, but the surface was uneven, leading to partial oxidation of the BaSi2 film. On the other hand, the sample without such templates showed a smoother surface but was confirmed to be polycrystalline. When a template formed by the combination of solid phase epitaxy (SPE) and subsequent annealing for 30 min was used, a-axis-oriented BaSi2 together with 111-oriented Si appeared in the θ–2θ x-ray diffraction (XRD) patterns. The fact that no crystalline Si was detected by the surface-sensitive Raman spectroscopy and that the full width at half maximum of the XRD BaSi2 600 peak was increased to 2.686° in such samples suggests that Si aggregates were at the BaSi2/Ge interface. The photoresponsivity of the epitaxial BaSi2 film with MBE-grown templates reached 0.14 A W−1 at a wavelength of 790 nm. This is the highest photoresponsivity reported so far for BaSi2 films on Ge substrates. Even for samples without the MBE-grown templates, SPE-grown templates significantly increased the photoresponsivity up to 0.10 A W−1. These results confirm that the template has a significant impact on the photoresponsivity of BaSi2 films on Ge(111) substrates.
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模板对分子束外延法在 Ge(111) 基质上生长的 BaSi2 薄膜光致发光性的影响
在硅(111)基底上外延生长的 BaSi2 薄膜已经证明,BaSi2 模板可以作为分子束外延 (MBE) 的 BaSi2 叠层的籽晶,并显示出很高的光致发射率,但在 Ge(111) 基底上还没有显示出来。我们研究了各种模板对在 Ge(111) 基质上生长的 BaSi2 薄膜光致发光率的影响。使用 MBE 生长模板的样品具有较高的 a 轴取向性,但表面不平整,导致 BaSi2 薄膜部分氧化。另一方面,没有此类模板的样品表面更光滑,但已确认为多晶。当使用固相外延(SPE)和随后的 30 分钟退火相结合形成的模板时,θ-2θ X 射线衍射(XRD)图中出现了面向 a 轴的 BaSi2 和面向 111 轴的 Si。表面敏感拉曼光谱检测不到结晶硅,而且在这些样品中,X 射线衍射 BaSi2 600 峰的半最大全宽增加到 2.686°,这表明硅聚集在 BaSi2/Ge 界面上。采用 MBE 生长模板的外延 BaSi2 薄膜在波长为 790 纳米时的光致发光率达到 0.14 A W-1。这是迄今为止报告的 Ge 基底上的 BaSi2 薄膜的最高光致反射率。即使是没有 MBE 生长模板的样品,SPE 生长模板也能显著提高光致反射率,最高可达 0.10 A W-1。这些结果证实,模板对 Ge(111)衬底上的 BaSi2 薄膜的光致发光率有重大影响。
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