{"title":"Improving AR metrology: cost and risk cuts via optical referencing innovation","authors":"Thomas Kerst, Jesper Leppinen, Mikael Jokinen","doi":"10.1117/12.2692659","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":517740,"journal":{"name":"Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) V","volume":"115 2","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-03-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optical Architectures for Displays and Sensing in Augmented, Virtual, and Mixed Reality (AR, VR, MR) V","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1117/12.2692659","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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