Jasper Mariën, M. Jayapala, A. Lambrechts, Chris Van Hoof, A. Yurt
{"title":"Single microparticle characterization usingmulti-wavelength lens-free imaging","authors":"Jasper Mariën, M. Jayapala, A. Lambrechts, Chris Van Hoof, A. Yurt","doi":"10.1364/optcon.516373","DOIUrl":null,"url":null,"abstract":"","PeriodicalId":506733,"journal":{"name":"Optics Continuum","volume":"21 4","pages":""},"PeriodicalIF":0.0000,"publicationDate":"2024-02-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Optics Continuum","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.1364/optcon.516373","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"","JCRName":"","Score":null,"Total":0}
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