Diego Monferrer Tirado, M. A. Moliner Tena, Marta Estrada
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引用次数: 0
Abstract
Purpose
This study aims to examine the co-creation of customer experiences at different levels in service ecosystems, analyzing the case of a tourist destination.
Design/methodology/approach
A questionnaire was designed based on previously validated scales. The questionnaire was distributed through the social media platforms Facebook and Instagram. The survey yielded 1,476 valid responses for three types of destinations. Structural equation modeling and multigroup analysis were performed to test the hypotheses.
Findings
Aggregate service experience and memorable customer experience (MCE) in service ecosystems are determined by customer experiences at a dyadic level. Service experience at the ecosystem level is formed from ordinary experiences at the actor level, while MCE is formed from extraordinary experiences at the dyadic level. The type of ecosystem moderates the relationships between the variables but does not alter the importance of each of them.
Originality/value
The relationship between the co-creation of customer experiences at different levels of service ecosystems (dyadic vs aggregate) is addressed. A relationship is established between the ordinary and extraordinary character of experiences and their memorability at the ecosystem level.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
Indexed/Abstracted:
Web of Science SCIE
Scopus
CAS
INSPEC
Portico