Electron screening length identifying circular dichroism of photoemission

IF 1.8 4区 物理与天体物理 Q2 SPECTROSCOPY Journal of Electron Spectroscopy and Related Phenomena Pub Date : 2024-04-23 DOI:10.1016/j.elspec.2024.147439
Jiwon Jeon, J.D. Lee
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Abstract

Circular dichroism angle-resolved photoemission spectroscopy (CD-ARPES) receives much attention due to a resolving power of topological and quantum geometrical nature of two-dimensional systems. We propose the Lippmann-Schwinger photoelectron final state, a scattering solution of the lattice model comprising screened short-range potentials at periodically arranged atomic sites, which characterizes the time-reversed low energy electron diffraction (LEED) state well enough to describe the final state effect entailed in CD-ARPES. We find that, through the final state effect, the electron screening length identifies CD-ARPES not only in the qualitative dichroic polarity but also in the quantitative dichroic strength in various graphene systems like the monolayer graphene, the AA-stacking bilayer graphene, and the twisted bilayer graphene especially in a unified fashion. This finding reveals an interplay between electron screening and circular dichroism and enables to extend the spectroscopic expertise of CD-ARPES to a direct probe of the electron screening.

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识别光辐射圆二色性的电子筛选长度
圆二色性角度分辨光发射光谱(CD-ARPES)因其对二维系统拓扑和量子几何性质的分辨能力而备受关注。我们提出了李普曼-施温格光电子终态,这是一种晶格模型的散射解,由周期性排列的原子位点上的屏蔽短程电势组成,它描述了时间反转的低能电子衍射(LEED)态,足以描述 CD-ARPES 中的终态效应。我们发现,通过终态效应,电子屏蔽长度不仅能确定 CD-ARPES 的定性分色极性,还能确定各种石墨烯体系(如单层石墨烯、AA 叠双层石墨烯和扭曲双层石墨烯)的定量分色强度,尤其是统一的分色强度。这一发现揭示了电子屏蔽和圆二色性之间的相互作用,并使 CD-ARPES 的光谱专业知识扩展到对电子屏蔽的直接探测。
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来源期刊
CiteScore
3.30
自引率
5.30%
发文量
64
审稿时长
60 days
期刊介绍: The Journal of Electron Spectroscopy and Related Phenomena publishes experimental, theoretical and applied work in the field of electron spectroscopy and electronic structure, involving techniques which use high energy photons (>10 eV) or electrons as probes or detected particles in the investigation.
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