Investigation of group 13 elements as potential candidates for p-type dopants in the narrow-gap thermoelectric semiconductor α-SrSi2

IF 3.9 3区 材料科学 Q2 MATERIALS SCIENCE, MULTIDISCIPLINARY Journal of Materials Science Pub Date : 2024-04-25 DOI:10.1007/s10853-024-09653-x
Haruno Kunioka, Daishi Shiojiri, Shinta Takahashi, Kota Hiratsuka, Masato Yamaguchi, Naomi Hirayama, Yoji Imai, Motoharu Imai, Tsutomu Iida
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Abstract

To investigate the possibility of p-type doping of α-SrSi2, a promising as an eco-friendly thermoelectric material, the energy changes of substitutions of the Si site of α-SrSi2 by group 13 elements were evaluated using first-principles calculations. It is found that Ga doping was the most energetically favorable dopant while In is the most unfavorable. We examined the synthesis of Ga- and In-doped α-SrSi2 using the vertical Bridgeman method and investigated their thermoelectric properties. The Ga atoms were doped to α-SrSi2 successfully up to 1.0 at. %, while In atoms could not be doped as suggested by calculations. For experimental prepared Ga-doped samples, the carrier density was observed to increase with Ga doping, from 3.58 × 1019 cm−3 for undoped α-SrSi2 to 4.49 × 1020 cm−3 for a 1.0 at. % Ga-doped sample at 300 K. The temperature dependence of carrier concentrations was observed to change from negative to positive with increasing Ga content. In addition, the temperature dependence of the Seebeck coefficient was also observed to change from negative to positive with increasing Ga content. The results indicate that α-SrSi2 undergoes a semiconductor–metal transition with Ga doping. The power factor for the undoped sample was quite high, at 2.5 mW/mK2, while the sample with 0.3 at. % Ga had a value of 1.1 mW/mK2 at room temperature.

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研究作为窄隙热电半导体 α-SrSi2 中 p 型掺杂剂潜在候选物质的 13 族元素
α-SrSi2是一种很有前途的环保型热电材料,为了研究α-SrSi2的p型掺杂的可能性,我们利用第一原理计算评估了13族元素取代α-SrSi2硅位点的能量变化。结果发现,掺杂镓元素是能量上最有利的掺杂剂,而掺杂铟元素则是最不利的掺杂剂。我们采用垂直布里奇曼法研究了掺杂镓和铟的 α-SrSi2 的合成,并考察了它们的热电性能。α-SrSi2 成功掺入了高达 1.0 at. % 的镓原子,而铟原子却无法掺入,这与计算结果不符。对于实验制备的掺嘎样品,观察到载流子密度随着掺嘎的增加而增加,在 300 K 时,未掺嘎的 α-SrSi2 的载流子密度为 3.58 × 1019 cm-3 ,而掺嘎 1.0 at.此外,随着镓含量的增加,塞贝克系数的温度依赖性也从负值变为正值。结果表明,α-SrSi2 在掺入镓后发生了半导体-金属转变。未掺杂样品的功率因数相当高,为 2.5 mW/mK2,而含 0.3 at.%镓的样品在室温下的功率因数为 1.1 mW/mK2。
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来源期刊
Journal of Materials Science
Journal of Materials Science 工程技术-材料科学:综合
CiteScore
7.90
自引率
4.40%
发文量
1297
审稿时长
2.4 months
期刊介绍: The Journal of Materials Science publishes reviews, full-length papers, and short Communications recording original research results on, or techniques for studying the relationship between structure, properties, and uses of materials. The subjects are seen from international and interdisciplinary perspectives covering areas including metals, ceramics, glasses, polymers, electrical materials, composite materials, fibers, nanostructured materials, nanocomposites, and biological and biomedical materials. The Journal of Materials Science is now firmly established as the leading source of primary communication for scientists investigating the structure and properties of all engineering materials.
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