{"title":"Pin-on-Plate vs. Pin-on-Disk Wear Tests: Theoretical and Numerical Observations on the Initial Transient Phase","authors":"F. Di Puccio, Andrea Di Pietro, Lorenza Mattei","doi":"10.3390/lubricants12040134","DOIUrl":null,"url":null,"abstract":"Pin-on-plate and pin-on-disk wear tests are typically used for assessing the wear behavior of a given material coupling and estimating its wear coefficient using the Archard wear law. This study investigates differences in the Archard law for pin-on-plate and pin-on-disk cases, particularly for flat-ended pins. Both analytical and finite element models of the two tests were developed, assuming a 21 N normal load and a 50π mm sliding distance. In pin-on-disk simulations three different distances between pin and disk axes were considered, i.e., 1.25–2.5–5 times the pin radius (5 mm). For the results, wear volumes, pressure and wear depth maps were compared. Some interesting aspects arose: (i) the rotational effect in pin-on-disk tests causes higher wear volumes (up to 13%) with respect to pin-on-plate tests: the nearer the pin to the disk axis, the higher the wear volume; (ii) a simple quadratic formula is defined to correct the wear volume estimation for pin-on-disk tests; (iii) pressure redistribution occurs with higher values closer to disk axis, opposite to the wear depth trend. Due to the high computational costs, only the running-in phase of wear tests was considered. Numerical strategies are currently under investigation to extend this study to the steady state phase.","PeriodicalId":3,"journal":{"name":"ACS Applied Electronic Materials","volume":"111 2","pages":""},"PeriodicalIF":4.7000,"publicationDate":"2024-04-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"ACS Applied Electronic Materials","FirstCategoryId":"5","ListUrlMain":"https://doi.org/10.3390/lubricants12040134","RegionNum":3,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q1","JCRName":"ENGINEERING, ELECTRICAL & ELECTRONIC","Score":null,"Total":0}
引用次数: 0
Abstract
Pin-on-plate and pin-on-disk wear tests are typically used for assessing the wear behavior of a given material coupling and estimating its wear coefficient using the Archard wear law. This study investigates differences in the Archard law for pin-on-plate and pin-on-disk cases, particularly for flat-ended pins. Both analytical and finite element models of the two tests were developed, assuming a 21 N normal load and a 50π mm sliding distance. In pin-on-disk simulations three different distances between pin and disk axes were considered, i.e., 1.25–2.5–5 times the pin radius (5 mm). For the results, wear volumes, pressure and wear depth maps were compared. Some interesting aspects arose: (i) the rotational effect in pin-on-disk tests causes higher wear volumes (up to 13%) with respect to pin-on-plate tests: the nearer the pin to the disk axis, the higher the wear volume; (ii) a simple quadratic formula is defined to correct the wear volume estimation for pin-on-disk tests; (iii) pressure redistribution occurs with higher values closer to disk axis, opposite to the wear depth trend. Due to the high computational costs, only the running-in phase of wear tests was considered. Numerical strategies are currently under investigation to extend this study to the steady state phase.
期刊介绍:
ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric.
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