Pin-on-Plate vs. Pin-on-Disk Wear Tests: Theoretical and Numerical Observations on the Initial Transient Phase

IF 4.7 3区 材料科学 Q1 ENGINEERING, ELECTRICAL & ELECTRONIC ACS Applied Electronic Materials Pub Date : 2024-04-17 DOI:10.3390/lubricants12040134
F. Di Puccio, Andrea Di Pietro, Lorenza Mattei
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Abstract

Pin-on-plate and pin-on-disk wear tests are typically used for assessing the wear behavior of a given material coupling and estimating its wear coefficient using the Archard wear law. This study investigates differences in the Archard law for pin-on-plate and pin-on-disk cases, particularly for flat-ended pins. Both analytical and finite element models of the two tests were developed, assuming a 21 N normal load and a 50π mm sliding distance. In pin-on-disk simulations three different distances between pin and disk axes were considered, i.e., 1.25–2.5–5 times the pin radius (5 mm). For the results, wear volumes, pressure and wear depth maps were compared. Some interesting aspects arose: (i) the rotational effect in pin-on-disk tests causes higher wear volumes (up to 13%) with respect to pin-on-plate tests: the nearer the pin to the disk axis, the higher the wear volume; (ii) a simple quadratic formula is defined to correct the wear volume estimation for pin-on-disk tests; (iii) pressure redistribution occurs with higher values closer to disk axis, opposite to the wear depth trend. Due to the high computational costs, only the running-in phase of wear tests was considered. Numerical strategies are currently under investigation to extend this study to the steady state phase.
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针对板与针对盘磨损试验:对初始瞬态阶段的理论和数值观察
销对板和销对盘磨损试验通常用于评估特定材料耦合的磨损行为,并使用阿卡德磨损定律估算其磨损系数。本研究调查了针对板和针对盘情况下阿卡德定律的差异,特别是平端销的差异。假设法向载荷为 21 N,滑动距离为 50π mm,对这两种测试建立了分析模型和有限元模型。在销对盘模拟中,考虑了销和盘轴之间的三种不同距离,即销半径(5 毫米)的 1.25-2.5-5 倍。对结果、磨损量、压力和磨损深度图进行了比较。出现了一些有趣的方面:(i) 针对盘测试中的旋转效应导致磨损量比针对板测试高(高达 13%):针越靠近盘轴,磨损量越大;(ii) 定义了一个简单的二次公式来修正针对盘测试的磨损量估算;(iii) 压力再分布发生在靠近盘轴的较高值,与磨损深度趋势相反。由于计算成本较高,只考虑了磨损试验的磨合阶段。目前正在研究将这项研究扩展到稳态阶段的数值策略。
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来源期刊
CiteScore
7.20
自引率
4.30%
发文量
567
期刊介绍: ACS Applied Electronic Materials is an interdisciplinary journal publishing original research covering all aspects of electronic materials. The journal is devoted to reports of new and original experimental and theoretical research of an applied nature that integrate knowledge in the areas of materials science, engineering, optics, physics, and chemistry into important applications of electronic materials. Sample research topics that span the journal's scope are inorganic, organic, ionic and polymeric materials with properties that include conducting, semiconducting, superconducting, insulating, dielectric, magnetic, optoelectronic, piezoelectric, ferroelectric and thermoelectric. Indexed/​Abstracted: Web of Science SCIE Scopus CAS INSPEC Portico
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