Tuukka Mustapää, Sami Koskinen, Mikael Sundfors, Joakim Jonsson, Kennet Riska, Lasse Löytynoja, Jan-Anders Broo
{"title":"Enabling the use of digital calibration certificates in industrial calibration management systems","authors":"Tuukka Mustapää, Sami Koskinen, Mikael Sundfors, Joakim Jonsson, Kennet Riska, Lasse Löytynoja, Jan-Anders Broo","doi":"10.5194/jsss-13-71-2024","DOIUrl":null,"url":null,"abstract":"Abstract. Metrology has been a slowly digitalizing field in which a significant part of the handling of data has been dependent on paper-based processes. Due to the need for the improved efficiency and reliability of these processes, digitalization has become a major topic of interest in the metrology community. Data formats such as the digital calibration certificate (DCC) have an essential role as an enabler of further digitalization, acting as the harmonized data format for calibration data. Naturally, introducing these data formats into industrial usage sets new requirements with respect to the calibration management and associated systems. Diversity of metrology also means that the systems need to be flexible and scalable to fulfill the needs of actors in the global calibration infrastructure with very different requirements. This paper presents a conceptual approach for enhancing the communications between the existing systems in a calibration ecosystem and enabling DCC-based data exchange with third-party systems using the Beamex calibration ecosystem as an example. Thus, the presented system architecture concept that introduces data and DCC exchange services would provide a solution to enable the use of DCCs on Beamex systems.\n","PeriodicalId":17167,"journal":{"name":"Journal of Sensors and Sensor Systems","volume":null,"pages":null},"PeriodicalIF":0.8000,"publicationDate":"2024-04-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":"0","resultStr":null,"platform":"Semanticscholar","paperid":null,"PeriodicalName":"Journal of Sensors and Sensor Systems","FirstCategoryId":"1085","ListUrlMain":"https://doi.org/10.5194/jsss-13-71-2024","RegionNum":0,"RegionCategory":null,"ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":null,"EPubDate":"","PubModel":"","JCR":"Q4","JCRName":"INSTRUMENTS & INSTRUMENTATION","Score":null,"Total":0}
引用次数: 0
Abstract
Abstract. Metrology has been a slowly digitalizing field in which a significant part of the handling of data has been dependent on paper-based processes. Due to the need for the improved efficiency and reliability of these processes, digitalization has become a major topic of interest in the metrology community. Data formats such as the digital calibration certificate (DCC) have an essential role as an enabler of further digitalization, acting as the harmonized data format for calibration data. Naturally, introducing these data formats into industrial usage sets new requirements with respect to the calibration management and associated systems. Diversity of metrology also means that the systems need to be flexible and scalable to fulfill the needs of actors in the global calibration infrastructure with very different requirements. This paper presents a conceptual approach for enhancing the communications between the existing systems in a calibration ecosystem and enabling DCC-based data exchange with third-party systems using the Beamex calibration ecosystem as an example. Thus, the presented system architecture concept that introduces data and DCC exchange services would provide a solution to enable the use of DCCs on Beamex systems.
期刊介绍:
Journal of Sensors and Sensor Systems (JSSS) is an international open-access journal dedicated to science, application, and advancement of sensors and sensors as part of measurement systems. The emphasis is on sensor principles and phenomena, measuring systems, sensor technologies, and applications. The goal of JSSS is to provide a platform for scientists and professionals in academia – as well as for developers, engineers, and users – to discuss new developments and advancements in sensors and sensor systems.